Untersuchungen diffusionsinduzierter Defekte in GaP mittels Transmissionselektronenmikroskopie /
Saved in:
| OCLC: | 51538024 |
|---|---|
| 主要作者: | |
| 企业作者: | |
| 语言: | German |
| 出版: |
Germany :
Universität Kiel,
2002.
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| 格式: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |