Untersuchungen diffusionsinduzierter Defekte in GaP mittels Transmissionselektronenmikroskopie /
Guardado en:
| OCLC: | 51538024 |
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| Autor principal: | |
| Autor Corporativo: | |
| Lenguaje: | German |
| Publicado: |
Germany :
Universität Kiel,
2002.
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| Formato: | Tesis Monograph Note that CRL will digitize material from the collection when copyright allows. |