The electrical activity of defects created in silicon single crystals during ion implantation /
Zapisane w:
| OCLC: | 3928247 |
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| 1. autor: | |
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| Język: | English |
| Wydane: |
Göteborg,
1973.
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| Seria: | Doktorsavhandlingar vid Chalmers tekniska högskola.
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| Hasła przedmiotowe: | |
| Format: | Praca dyplomowa Monograph Note that CRL will digitize material from the collection when copyright allows. |