The electrical activity of defects created in silicon single crystals during ion implantation /
Enregistré dans:
| OCLC: | 3928247 |
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| Langue: | English |
| Publié: |
Göteborg,
1973.
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| Collection: | Doktorsavhandlingar vid Chalmers tekniska högskola.
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| Format: | Thèse Monograph Note that CRL will digitize material from the collection when copyright allows. |