The electrical activity of defects created in silicon single crystals during ion implantation /
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OCLC: | 3928247 |
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Jazyk: | English |
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Göteborg,
1973.
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Edice: | Doktorsavhandlingar vid Chalmers tekniska högskola.
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Médium: | Diplomová práce Monograph Note that CRL will digitize material from the collection when copyright allows. |