The electrical activity of defects created in silicon single crystals during ion implantation /
Bewaard in:
| OCLC: | 3928247 |
|---|---|
| Hoofdauteur: | |
| Coauteur: | |
| Taal: | English |
| Gepubliceerd in: |
Göteborg,
1973.
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| Reeks: | Doktorsavhandlingar vid Chalmers tekniska högskola.
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| Onderwerpen: | |
| Formaat: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |