The electrical activity of defects created in silicon single crystals during ion implantation /
Gardado en:
OCLC: | 3928247 |
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Autor Principal: | |
Autor Corporativo: | |
Idioma: | English |
Publicado: |
Göteborg,
1973.
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Series: | Doktorsavhandlingar vid Chalmers tekniska högskola.
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Subjects: | |
Formato: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |
descrición da copia: | Photocopy. 1974. -- 30 cm. |
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Descrición Física: | [78] leaves : ill. |
Bibliografía: | Includes bibliographical references. |
Lugar de Publicación: | Sweden. |