Current noise in n-channel Si-MOSFET's at cryogenic temperatures /
Gardado en:
| OCLC: | 64815285 |
|---|---|
| Autor Principal: | |
| Autor Corporativo: | |
| Idioma: | English |
| Publicado: |
[S.l. :
s.n.],
1987.
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| Subjects: | |
| Formato: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |