Simultaneous determination of specimen composition and thickness using the transmission electron microscope : proefschrift

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书目详细资料
OCLC:44794068
主要作者: Boon, Gerben
企业作者: Technische Universiteit Eindhoven
语言:English
出版: Eindhoven : Technische Universiteit Eindhoven, 2000.
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Thesis Monograph

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P-00251588 可用