APA引文

Meijer, E. (1982). Characterization of some technically important defects in semiconductors. Lunds universitet.

Chicago Style (17th ed.) Citation

Meijer, Erik. Characterization of Some Technically Important Defects in Semiconductors. Sweden: Lunds universitet, 1982.

MLA引文

Meijer, Erik. Characterization of Some Technically Important Defects in Semiconductors. Lunds universitet, 1982.

警告：這些引文格式不一定是100％准確.