APA (7th ed.) Citation

Meijer, E. (1982). Characterization of some technically important defects in semiconductors. Lunds universitet.

Chicago Style (17th ed.) Citation

Meijer, Erik. Characterization of Some Technically Important Defects in Semiconductors. Sweden: Lunds universitet, 1982.

MLA (8th ed.) Citation

Meijer, Erik. Characterization of Some Technically Important Defects in Semiconductors. Lunds universitet, 1982.