Meijer, E. (1982). Characterization of some technically important defects in semiconductors. Lunds universitet.
Citace podle Chicago (17th ed.)Meijer, Erik. Characterization of Some Technically Important Defects in Semiconductors. Sweden: Lunds universitet, 1982.
Citace podle MLA (8th ed.)Meijer, Erik. Characterization of Some Technically Important Defects in Semiconductors. Lunds universitet, 1982.
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