Meijer, E. (1982). Characterization of some technically important defects in semiconductors. Lunds universitet.
शिकागो शैली (17वां संस्करण) प्रशस्ति पत्रMeijer, Erik. Characterization of Some Technically Important Defects in Semiconductors. Sweden: Lunds universitet, 1982.
एमएलए (8वां संस्करण) प्रशस्ति पत्रMeijer, Erik. Characterization of Some Technically Important Defects in Semiconductors. Lunds universitet, 1982.
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