Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
Saved in:
| OCLC: | 48217405 |
|---|---|
| 主要作者: | |
| 企業作者: | |
| 語言: | English |
| 出版: |
2000.
|
| 主題: | |
| 格式: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |