Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /

Sparad:
Bibliografiska uppgifter
OCLC:48217405
Huvudupphovsman: Mannelquist, Anders
Institutionell upphovsman: Luleå University of Technology
Språk:English
Publicerad: 2000.
Ämnen:
near-field scanning optimal microscopy > atomic force microscopy > fractal characterization.
Materialtyp:

Lärdomsprov Monograph

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diss.2000 P-00000675 Tillgänglig

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