Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
Zapisane w:
| OCLC: | 48217405 |
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| 1. autor: | |
| Korporacja: | |
| Język: | English |
| Wydane: |
2000.
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| Hasła przedmiotowe: | |
| Format: | Praca dyplomowa Monograph Note that CRL will digitize material from the collection when copyright allows. |