Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /

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Bibliografische gegevens
OCLC:48217405
Hoofdauteur: Mannelquist, Anders
Coauteur: Luleå University of Technology
Taal:English
Gepubliceerd in: 2000.
Onderwerpen:
near-field scanning optimal microscopy > atomic force microscopy > fractal characterization.
Formaat:

Thesis Monograph

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Omschrijving Local Call Number Status
diss.2000 P-00000675 Beschikbaar

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