Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
Salvato in:
OCLC: | 48217405 |
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Autore principale: | |
Ente Autore: | |
Lingua: | English |
Pubblicazione: |
2000.
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Soggetti: | |
Natura: | Tesi Monograph Note that CRL will digitize material from the collection when copyright allows. |
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Item List
Descrizione | Local Call Number | Status |
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diss.2000 | P-00000675 | Disponibile |