Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /

में बचाया:
ग्रंथसूची विवरण
OCLC:48217405
मुख्य लेखक: Mannelquist, Anders
निगमित लेखक: Luleå University of Technology
भाषा:English
प्रकाशित: 2000.
विषय:
स्वरूप:

थीसिस Monograph

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विवरण Local Call Number स्थिति
diss.2000 P-00000675 उपलब्ध