Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
Gardado en:
OCLC: | 48217405 |
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Autor Principal: | |
Autor Corporativo: | |
Idioma: | English |
Publicado: |
2000.
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Subjects: | |
Formato: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |