Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /

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Detalles Bibliográficos
OCLC:48217405
Autor Principal: Mannelquist, Anders
Autor Corporativo: Luleå University of Technology
Idioma:English
Publicado: 2000.
Subjects:
Formato:

Thesis Monograph

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Descripción Local Call Number Status
diss.2000 P-00000675 Dispoñible