Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /

Sábháilte in:
Sonraí bibleagrafaíochta
OCLC:48217405
Príomhchruthaitheoir: Mannelquist, Anders
Údar corparáideach: Luleå University of Technology
Teanga:English
Foilsithe / Cruthaithe: 2000.
Ábhair:
Formáid:

Tráchtas Monograph

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Cur síos Local Call Number Stádas
diss.2000 P-00000675 Ar fáil