Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /

Gorde:
Xehetasun bibliografikoak
OCLC:48217405
Egile nagusia: Mannelquist, Anders
Erakunde egilea: Luleå University of Technology
Hizkuntza:English
Argitaratua: 2000.
Gaiak:
near-field scanning optimal microscopy > atomic force microscopy > fractal characterization.
Formatua:

Thesis Monograph

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Deskribapena Local Call Number Egoera
diss.2000 P-00000675 Eskuragarri

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