Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
Gespeichert in:
| OCLC: | 48217405 |
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| 1. Verfasser: | |
| Körperschaft: | |
| Sprache: | English |
| Veröffentlicht: |
2000.
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| Schlagworte: | |
| Format: | Abschlussarbeit Monograph Note that CRL will digitize material from the collection when copyright allows. |