Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /

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Bibliografiske detaljer
OCLC:48217405
Hovedforfatter: Mannelquist, Anders
Institution som forfatter: Luleå University of Technology
Sprog:English
Udgivet: 2000.
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Format:

Thesis Monograph

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Beskrivelse Local Call Number Status
diss.2000 P-00000675 Tilgængelig