Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
OCLC:48217405
Prif Awdur: Mannelquist, Anders
Awdur Corfforaethol: Luleå University of Technology
Iaith:English
Cyhoeddwyd: 2000.
Pynciau:
Fformat:

Traethawd Ymchwil Monograph

Note that CRL will digitize material from the collection when copyright allows.

Borrow this resource

Item List

Disgrifiad Local Call Number Statws
diss.2000 P-00000675 Ar gael