Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /

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OCLC:48217405
Autor principal: Mannelquist, Anders
Autor corporatiu: Luleå University of Technology
Idioma:English
Publicat: 2000.
Matèries:
Format:

Thesis Monograph

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Descripció Local Call Number Estat
diss.2000 P-00000675 Disponible