Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
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| OCLC: | 48217405 |
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| 主要作者: | |
| 企业作者: | |
| 语言: | English |
| 出版: |
2000.
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| 主题: | |
| 格式: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |
| 实物描述: | 1 v. (various pagings) : ill. ; 24 cm. |
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| 参考书目: | Includes bibliographical references. |
| Place of Publication: | Sweden. |