Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
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| OCLC: | 48217405 |
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| 主要作者: | |
| 企業作者: | |
| 語言: | English |
| 出版: |
2000.
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| 主題: | |
| 格式: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |
| 實物描述: | 1 v. (various pagings) : ill. ; 24 cm. |
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| 參考書目: | Includes bibliographical references. |
| Place of Publication: | Sweden. |