Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
Kaydedildi:
OCLC: | 48217405 |
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Yazar: | |
Müşterek Yazar: | |
Dil: | English |
Baskı/Yayın Bilgisi: |
2000.
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Konular: | |
Materyal Türü: | Tez Monograph Note that CRL will digitize material from the collection when copyright allows. |
Fiziksel Özellikler: | 1 v. (various pagings) : ill. ; 24 cm. |
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Bibliyografya: | Includes bibliographical references. |
Yayın Yeri: | Sweden. |