Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
Sparad:
| OCLC: | 48217405 |
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| Huvudupphovsman: | |
| Institutionell upphovsman: | |
| Språk: | English |
| Publicerad: |
2000.
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| Ämnen: | |
| Materialtyp: | Lärdomsprov Monograph Note that CRL will digitize material from the collection when copyright allows. |
| Fysisk beskrivning: | 1 v. (various pagings) : ill. ; 24 cm. |
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| Bibliografi: | Includes bibliographical references. |
| Utgivningsort: | Sweden. |