Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
Shranjeno v:
| OCLC: | 48217405 |
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| Glavni avtor: | |
| Korporativna značnica: | |
| Jezik: | English |
| Izdano: |
2000.
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| Teme: | |
| Format: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |
| Fizični opis: | 1 v. (various pagings) : ill. ; 24 cm. |
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| Bibliografija: | Includes bibliographical references. |
| Place of Publication: | Sweden. |