Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
保存先:
OCLC: | 48217405 |
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第一著者: | |
団体著者: | |
言語: | English |
出版事項: |
2000.
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主題: | |
フォーマット: | 学位論文 Monograph Note that CRL will digitize material from the collection when copyright allows. |
物理的記述: | 1 v. (various pagings) : ill. ; 24 cm. |
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書誌: | Includes bibliographical references. |
出版地: | Sweden. |