Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /

Sábháilte in:
Sonraí bibleagrafaíochta
OCLC:48217405
Príomhchruthaitheoir: Mannelquist, Anders
Údar corparáideach: Luleå University of Technology
Teanga:English
Foilsithe / Cruthaithe: 2000.
Ábhair:
Formáid:

Tráchtas Monograph

Note that CRL will digitize material from the collection when copyright allows.

Cur síos
Cur síos fisiciúil:1 v. (various pagings) : ill. ; 24 cm.
Leabharliosta:Includes bibliographical references.
Áit a fhoilsithe:Sweden.