Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
Enregistré dans:
| OCLC: | 48217405 |
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| Auteur principal: | |
| Collectivité auteur: | |
| Langue: | English |
| Publié: |
2000.
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| Sujets: | |
| Format: | Thèse Monograph Note that CRL will digitize material from the collection when copyright allows. |
| Description matérielle: | 1 v. (various pagings) : ill. ; 24 cm. |
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| Bibliographie: | Includes bibliographical references. |
| Lieu de publication: | Sweden. |