Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
Gorde:
| OCLC: | 48217405 |
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| Egile nagusia: | |
| Erakunde egilea: | |
| Hizkuntza: | English |
| Argitaratua: |
2000.
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| Gaiak: | |
| Formatua: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |
| Deskribapen fisikoa: | 1 v. (various pagings) : ill. ; 24 cm. |
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| Bibliografia: | Includes bibliographical references. |
| Argitaratze lekua: | Sweden. |