Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
Guardado en:
| OCLC: | 48217405 |
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| Autor principal: | |
| Autor Corporativo: | |
| Lenguaje: | English |
| Publicado: |
2000.
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| Materias: | |
| Formato: | Tesis Monograph Note that CRL will digitize material from the collection when copyright allows. |
| Descripción Física: | 1 v. (various pagings) : ill. ; 24 cm. |
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| Bibliografía: | Includes bibliographical references. |
| Lugar de publicación: | Sweden. |