Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods /
Saved in:
| OCLC: | 48217405 |
|---|---|
| Main Author: | |
| Corporate Author: | |
| Language: | English |
| Published: |
2000.
|
| Subjects: | |
| Format: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |
| Physical Description: | 1 v. (various pagings) : ill. ; 24 cm. |
|---|---|
| Bibliography: | Includes bibliographical references. |
| Place of Publication: | Sweden. |