APA (7. basım) Alıntı

Mannelquist, A. (2000). Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods.

Chicago Style (17. basım) Atıf

Mannelquist, Anders. Near-field Scanning Optimal Microscopy and Fractal Characterization with Atomic Force Microscopy and Other Methods. 2000.

MLA (8th ed.) Atıf

Mannelquist, Anders. Near-field Scanning Optimal Microscopy and Fractal Characterization with Atomic Force Microscopy and Other Methods. 2000.

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