APA (7e ed.) Bronvermelding

Mannelquist, A. (2000). Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods.

Chicago (17e ed.) Bronvermelding

Mannelquist, Anders. Near-field Scanning Optimal Microscopy and Fractal Characterization with Atomic Force Microscopy and Other Methods. 2000.

MLA (8e ed.) Bronvermelding

Mannelquist, Anders. Near-field Scanning Optimal Microscopy and Fractal Characterization with Atomic Force Microscopy and Other Methods. 2000.

Let op: Deze citaties zijn niet altijd 100% accuraat.