Mannelquist, A. (2000). Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods.
Style de citation Chicago (17e éd.)Mannelquist, Anders. Near-field Scanning Optimal Microscopy and Fractal Characterization with Atomic Force Microscopy and Other Methods. 2000.
Style de citation MLA (8e éd.)Mannelquist, Anders. Near-field Scanning Optimal Microscopy and Fractal Characterization with Atomic Force Microscopy and Other Methods. 2000.
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