Mannelquist, A. (2000). Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods.
Chicago-Zitierstil (17. Ausg.)Mannelquist, Anders. Near-field Scanning Optimal Microscopy and Fractal Characterization with Atomic Force Microscopy and Other Methods. 2000.
MLA-Zitierstil (8. Ausg.)Mannelquist, Anders. Near-field Scanning Optimal Microscopy and Fractal Characterization with Atomic Force Microscopy and Other Methods. 2000.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.