APA (7 ম সংস্করণ) উদ্ধৃতি

Mannelquist, A. (2000). Near-field scanning optimal microscopy and fractal characterization with atomic force microscopy and other methods.

শিকাগো স্টাইল (17 তম সংস্করণ) উদ্ধৃতি

Mannelquist, Anders. Near-field Scanning Optimal Microscopy and Fractal Characterization with Atomic Force Microscopy and Other Methods. 2000.

M.L.A (8 ম সংস্করণ) উদ্ধৃতি

Mannelquist, Anders. Near-field Scanning Optimal Microscopy and Fractal Characterization with Atomic Force Microscopy and Other Methods. 2000.