Condensed guide for the Stanford revision of the Binet-Simon intelligence tests,

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Bibliographic Details
OCLC:1447276
Main Author: Terman, Lewis M. (Lewis Madison), 1877-1956
Language:English
Published: Boston, New York [etc.] Houghton Mifflin Co. [c1920]
Series:Riverside textbooks in education, ed. by E.P. Cubberley ... Division of secondary education, under the editorial direction of Alexander Inglis.
Subjects:
Educational tests and measurements.
Intelligence tests.
Psychological tests.
Intelligence Tests.
Related Items:Online version: Condensed guide for the Stanford revision of the Binet-Simon intelligence tests.
Format:

Monograph

Note that CRL will digitize material from the collection when copyright allows.

Description
Physical Description:32 p. 22 cm.
Also issued online.

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