Terman, L. M. (1920). Condensed guide for the Stanford revision of the Binet-Simon intelligence tests. Houghton Mifflin Co.
Chicago Style (17th ed.) CitationTerman, Lewis M. Condensed Guide for the Stanford Revision of the Binet-Simon Intelligence Tests. Boston, New York [etc.]: Houghton Mifflin Co, 1920.
Cita MLATerman, Lewis M. Condensed Guide for the Stanford Revision of the Binet-Simon Intelligence Tests. Houghton Mifflin Co, 1920.
Atenció: Aquestes cites poden no estar 100% correctes.