Electron microscopy and structure models of defects in NB-Ge superconductors /
Shranjeno v:
| OCLC: | 54517635 |
|---|---|
| Glavni avtor: | |
| Korporativna značnica: | |
| Jezik: | English |
| Izdano: |
1987.
|
| Format: | Thesis Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |