Electron microscopy and structure models of defects in NB-Ge superconductors /
Saved in:
| OCLC: | 54517635 |
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| 主要作者: | |
| 企业作者: | |
| 语言: | English |
| 出版: |
1987.
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| 格式: | Thesis Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |
| 实物描述: | 3 microfiches. |
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| Place of Publication: | Switzerland. |