Electron microscopy and structure models of defects in NB-Ge superconductors /
Shranjeno v:
| OCLC: | 54517635 |
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| Glavni avtor: | |
| Korporativna značnica: | |
| Jezik: | English |
| Izdano: |
1987.
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| Format: | Thesis Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |
| Fizični opis: | 3 microfiches. |
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| Place of Publication: | Switzerland. |