Electron microscopy and structure models of defects in NB-Ge superconductors /
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OCLC: | 54517635 |
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Glavni autor: | |
Autor kompanije: | |
Jezik: | English |
Izdano: |
1987.
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Format: | Disertacija Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |
Opis: | 3 microfiches. |
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Mjesto izdanja: | Switzerland. |