Electron microscopy and structure models of defects in NB-Ge superconductors /
Sábháilte in:
| OCLC: | 54517635 |
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| Príomhchruthaitheoir: | |
| Údar corparáideach: | |
| Teanga: | English |
| Foilsithe / Cruthaithe: |
1987.
|
| Formáid: | Tráchtas Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |
| Cur síos fisiciúil: | 3 microfiches. |
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| Áit a fhoilsithe: | Switzerland. |